Atomic Force Microscopy
Atomic Force Microscopy is a very high-resolution type of scanning probe microscopy with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. The AFM three major abilities: force measurement, topographic imaging, and manipulation, make it a powerful method of investigation and visualization of a various life science targets. Additional information about the basics of AFM can be found on wikipedia page or by watching this youtube video.
The LS-AFM is a tip-scanning AFM designed specifically for life science applications when paired with an inverted fluorescent microscope. The product includes everything required for AFM scanning: AFM Stage, Inverted Microscope Adaptation Plate, Ebox, Manuals, Cables, and AFM-Control Software. The LS-AFM is designed for the most widely used types of measurements made with an AFM, including measuring F/D curves and imaging cells in a dry and liquid environment. PDF manual.